Combustion Elemental Analysis
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Xplorer-V N/S
Analytes: Total Nitrogen & Sulfur (ppb-ppm) via Chemiluminescence & Pulsed UV-Fluorescence.Sample Scope: Solids, gases, and LPGs.
ASTM Methods: D4629, D5176, D5453, D6667, D7183, D7184, D7551
Key Benefits:
Vertical furnace with self-cleaning Xpro-V™ tube (no catalysts).
Compact footprint.
Simultaneous analysis of nitrogen and sulfur.
TEIS Software- Intuitive and feature-rich.
Ultra-low detection limit, high stability, and reliability.
Analysis time 2.5-5 min.
Autosamplers:
Vectra - auto syringe exchange, contditioned trays/syringes, up to 350 liquid positions.
GLS - gas/LPG.
GBS - low-pressure gas bags.
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Xplorer TN/TS
Analytes: Total Nitrogen & Sulfur (ppb-ppm) via Chemiluminescence & Pulsed UV-Fluorescence.Sample Scope: Solids, liquids, gases, and LPGs.
ASTM Methods: D3120, D4629, D5762, D5453, D6069, D6667, D7183, D7184
Key Benefits:
Fast module change (<45s).
Compact footprint, <15 min startup.
Simultaneous analysis of nitrogen and sulfur.
TEIS Software- Intuitive and feature-rich.
Ultra-low detection limit, high stability, and reliability.
Autosamplers:
Vectra - auto syringe exchange, contditioned trays/syringes, up to 350 liquid positions.
GLS - gas/LPG.
GBS - low-pressure gas bags.
Newton - for solids (ex. polymer pellets).
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Xplorer TX/TS
Analytes: Total Chloride & Total Sulfur (ppb-ppm) via Combustion MicrocoulometrySample Scope: Solids, gases, and LPGs.
ASTM Methods: D4929, D5453
Key Benefits:
Compact design.
Incredible precision.
TEIS Software- Intuitive and feature-rich.
Ultra-low detection limit, high stability, and reliability.
Autosamplers:
Vectra - auto syringe exchange, contditioned trays/syringes, up to 350 liquid positions.
GLS - gas/LPG.
GBS - low-pressure gas bags.
Newton - for solids.
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XPrep C-IC
Analytes: Automated Sample Preperaration Solution for the Analysis of Total Fluorine, Chlorine, Bromine, and Iodine by Combustion Chromatography MethodSample Scope: Petrochemicals, (bio)fuels, LPGs, gases, organic solvents & chemicals, polymers (raw and final products).
ASTM Methods: D5987, D7359, D7994, D8150, D8247
Key Benefits:
Half the size of existing C-IC configurations.
Integrated sampling system- fraction collector (up to 65 samples)
TEIS Software- Intuitive and feature-rich.
Larger Sample Volume (up to 100 µL).
Automated sample introduction.
Oxidative pyrohydrolytic combustion.
Autosamplers:
Vectra - auto syringe exchange, contditioned trays/syringes, up to 350 liquid positions.
GLS - gas/LPG.
GBS - low-pressure gas bags.
Newton - for solids.
Tuscan- for delivering AOX/AOF column content into the XPrep C-IC sample boat.
Autosamplers
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GLS
Three Available Models
Standard
LPG - 353 psi
Gas - 725 psiExtended Pressure
LPG - 700 psi
Gas - 725 psiHigh Pressure
LPG - 1500 psi
Gas - 725 psi -
Vectra
Liquids Autosampler
Up to 350 samples.
High-performance conditioned trays.
High-performance conditioned syringes.
Auto syringe exchange (3 parking positions).
Position feedback and auto position recovery (no more bent needles). -
Newton
Solids Autosampler
Up to 60 positions.
For solids (ex. polymer pellets.)
Optimal preservation of samples using purge flow and protective lid.
Default & customized methods. -
Tuscan
AOX Column Autosampler
Easy and fast installation.
Fully automated.
Small footprint.
42 Positions.
Default & customized methods.
Automatically deliver AOX/TOX column content into the Xplorer or XPrep C-IC sample boat. -
GBS
Gas Bag Autosampler
Up to 10 gas bags automatically.
Calibration line from single CRM.
No sample pressure required.
Default & customized methods.
Horiba Scientific - Multi-Element Analyzers
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GD-OES Profiler 2
Advanced glow discharge optical emission spectrometer for versatile elemental analysis of conductive and non-conductive solids, including bulk materials, thin films, and multi-layer structures.
Performs both qualitative and quantitative analysis with high accuracy
Depth profiling at nanometer-level resolution, reaching up to 150 µm into complex, multi-layer samples
Enables verification of depth distribution repeatability for reliable results
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EMIA-Expert C/S Analyzer
Non-Dispersive InfraRed
Carbon
Measurement Range
0.6 ppm ~ 10.0%
Accuracy (Repeatability)
σn-1 ≦ 0.3 ppm or RSD ≦ 0.5%
Sulfur
Measurement Range
0.6 ppm ~ 1.0%
Accuracy (Repeatability)
σn-1 ≦ 0.3 ppm or RSD ≦ 0.75% -
EMIA-Pro C/S Analyzer
Non-Dispersive InfraRed
Carbon
Measurement Range
1.6 ppm ~ 6.0%
Accuracy (Repeatability)
σn-1 ≦ 2.0 ppm or RSD ≦ 1.0%
Sulfur
Measurement Range
2.0 ppm ~ 1.0%
Accuracy (Repeatability)
σn-1 ≦ 2.0 ppm or RSD ≦ 1.5% -
EMIA-Step C/S Analyzer
Non-Dispersive InfraRed
CarbonMeasurement Range
0.0003 〜 6.0% (m/m)Accuracy (Repeatability)
σn-1 ≦ 0.00015% (m/m) or RSD ≦ 0.75%Sulfur
Measurement range
0.0004 〜 1.0%(m/m)Accuracy (Repeatability)
σn-1 ≦ 0.00020% (m/m) or RSD ≦ 2.00% -
EMGA-Expert O/N/H Analyzer
Non-Dispersve InfraRed
Oxygen
Measurement Range
0.04ppm - 5%
Precision Repeatability
σn-1≦0.02ppm or RSD≦0.5% (GAS)
Nitrogen
Measurement Range
0.04 ppm - 3%
Precision Repeatability
σn-1≦0.02ppm or RSD≦0.5% (GAS)
Hydrogen
Measurement Range
0.08ppm - 2500ppm
Precision Repeatability
σn-1≦0.04ppm or RSD≦2.0% (GAS) -
EMGA-Expert 21E Hydrogen Analyzer
Thermal Conductivity Detector
Hydrogen
Measurement Range
0.04 ppm - 0.02%
Precision Repeatability
σn-1-≤0.04 ppm or CV≤0.5% (GAS) -
EMGA-Pro O/N Analyzer (O/H/N Option Available)
Oxygen
Measurement Range
0.1ppm - 0.3% (Low-concentration specification)
0.1% - 5% (High-concentration specification)
Precision Repeatability
σn-1≦0.05ppm or RSD≦0.5% (GAS) (Low-concentration specification) RSD≦0.5% (GAS) (High-concentration specification)
Nitrogen
Measurement Range
0.1 ppm - 0.3% (Low-concentration specification) 0.1% - 3% (High-concentration specification)
Precision Repeatability
σn-1≦0.05ppm or RSD≦0.5% (GAS) (Low-concentration specification) RSD≦0.5% (GAS) (High-concentration specification)
Horiba Scientific - X-Ray Analyzers
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SLFA 60
Ultra-low detection limits: Detects sulfur at levels as low as 20 ppm, and measures much higher concentrations—up to 9.9999 wt%—for crude and shale oil samples.
Truly portable: Compact footprint and a lightweight design — only 9 kg — so it’s easy to move between labs or field sites.
Built-in safety features: Each unit undergoes a factory X-ray leakage test, and operator protection is reinforced with a key switch and shield shutter.
Straightforward operation: Choose a calibration curve (or let the instrument auto-select via “A” mode), then press MEAS to start the measurement.
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SLFA-6800
Modern, user-friendly interface: The SLFA-6100/6800 features an optimized UI with a full-color display, USB output, optional data printout mode, and a compact, refined footprint. A protective shutter shield and a new key-switch function enhance X-ray safety, while a redesigned turntable improves sample handling.
Speed: Measurement times are configurable between 10 and 600 seconds.
Automation: The SLFA-6800 supports automated analysis of up to 8 samples on its turntable using pre-set conditions.
Simple operation: Select a calibration curve (or let the instrument auto-select using “A” mode) and press MEAS to begin.
Improved accuracy: Software supports up to five sets of three calibration curves, increasing accuracy and flexibility for different sample types.
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Mesa 7220v2
Dynamic Analysis Range
Sulfur: 0.7 ppm – 10.0 wt% • Chlorine: 0.6 ppm – 10.0 wt%
Auto-ranging extends measurement capability across calibration curves.
No purge gases required — simpler setup and lower operating cost.
Calibration capacity: up to 60 curves with extensive data-point support.
Flexible timing: measurement times from 30–999 seconds for sensitivity control.
Oxygen correction minimizes interference on sulfur readings.
Compatible sample types: solids, liquids, powders, pastes, pellets, and films.
Built-in interlocks for user safety against X-ray exposure.
High-performance detector: Silicon Drift Detector with X-ray Beryllium window.